SPECTROSCOPIC KERR INVESTIGATIONS OF CONI PT MULTILAYERS/

Citation
Wp. Vandrent et al., SPECTROSCOPIC KERR INVESTIGATIONS OF CONI PT MULTILAYERS/, Journal of applied physics, 79(8), 1996, pp. 6190-6192
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
8
Year of publication
1996
Part
2B
Pages
6190 - 6192
Database
ISI
SICI code
0021-8979(1996)79:8<6190:SKIOCP>2.0.ZU;2-H
Abstract
CoxNi1-x/Pt multilayers with x=0.4 and 0.5 were sputtered onto Si subs trates. Magnetic and spectroscopic magneto-optic measurements (1.4-5.2 eV) reveal a Kerr rotation up to -0.48 degrees at about 4.5 eV for a sample with rectangular hysteresis loop, about 170 kA/m coercivity, an d a Curie temperature of about 300 degrees C. Pt layers could be made extremely thin (2.9 Angstrom) without loss of perpendicular anisotropy and rectangular hysteresis loop. Simulations show that the Kerr rotat ion peak shifts back from 4.5 to 3.9 eV with increasing number of bila yers. (C) 1996 American Institute of Physics.