We will report on the exchange coupling, magnetoresistance (MR) and fi
lm structure in the system NiFe/Cu/CoFe/Cu as a function of multilayer
number (bilayers=6 to 20) and Cu spacing (5 to 31 Angstrom). The mult
ilayers were prepared by sputter deposition and investigated by x-ray
diffraction (XRD), atomic force microscopy(AFM), vibrating sample magn
etometry (VSM), ferromagnetic resonance (FMR), and standard MR methods
. The exchange coupling, H-ex, and MR are shown to vary with Cu spacin
g. The XRD data indicates the multilayer structure is evolving through
at least the first 20 bilayers. AFM measurements suggest subtle varia
tions in interface quality and a rms roughness near 0.4 nm. These vari
ations in structure are manifested in the FMR and MR. Multilayers with
Cu spacers >11 Angstrom generally show the expected two FMR peaks. So
me multilayers show three peaks indicating defects within the multilay
er. These defects can be viewed as the elusive ''pinholes'' which act
to ferromagnetically short the magnetic layers together. This demonstr
ates that FMR provides very valuable information about defects in noni
deal multilayers which is critical to our understanding and applicatio
ns of giant magnetoresistance (GMR) systems. (C) 1996 American Institu
te of Physics.