Diamond films 60 and 170 mu m in thickness were grown by PACVD (plasma
-assisted chemical vapor deposition) under similar conditions. The the
rmal diffusivity of these freestanding films was measured between 100
and 800 K using AC calorimetry. Radiation heat loss from the surface w
as estimated by analyzing both the amplitude and the phase shift of a
lock-in amplifier signal. Thermal conductivity was calculated using th
e specific heat data of natural diamond. At room temperature, the ther
mal conductivity of the 60 and 170 mu m films is 9 and 16 W . cm(-1).
K-1 respectively, which is 40-70% that of natural diamond. The tempera
ture dependence of thermal conductivity of the CVD diamond films is si
milar to that of natural diamond. Phonon scattering processes are cons
idered using the Debye model. The microsite of the grain boundary has
a significant effect on the mean free path of phonons at low temperatu
res. The grain in CVD diamond film is grown as a columnar structure. T
hus, the thicker film has the larger mean grain size and the higher th
ermal conductivity. Scanning electron microscopy (SEM) and Raman spect
roscopy were used to study the microstructure of the CVD diamond films
. In this experiment, we evaluated the quality of CVD diamond film of
the whole sample by measuring the thermal conductivity.