INITIAL-STAGES OF IN ADSORPTION ON SI(111) 7X7

Citation
Xf. Lin et al., INITIAL-STAGES OF IN ADSORPTION ON SI(111) 7X7, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 995-999
Citations number
42
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
2
Year of publication
1996
Pages
995 - 999
Database
ISI
SICI code
1071-1023(1996)14:2<995:IOIAOS>2.0.ZU;2-O
Abstract
Scanning tunneling microscopy and scanning tunneling spectroscopy have been used to study the initial stages of room-temperature deposition of In on a Si(111) 7x7 surface. Individual In atoms are observed resid ing atop the substrate Si adatoms and rest atoms at T-1 sites, showing different geometric configurations. An analysis of the In atomic stru ctures in the dual-bias scanning tunneling microscopy images leads us to conclude that the In half-filled p(z)-like sp(3) hybrids covalently bond to the Si partially filled p(z)-like sp(3) hybridized orbitals a nd the In p(x,y)-like sp(3) hybrids overlap with these on the nearby m etal atoms, also showing the covalent bonding. This is also supported by the scanning tunneling spectroscopy spectrum energy measurements ab out the Fermi level where the covalent bonding between the In and Si s aturates the Si intrinsic metallic surface states, producing a surface band gap similar to 1.7 eV. (C) 1996 American Vacuum Society.