ELECTRON INTERFERENCE IN A T-SHAPED QUANTUM TRANSISTOR BASED ON SCHOTTKY-GATE TECHNOLOGY

Citation
J. Appenzeller et al., ELECTRON INTERFERENCE IN A T-SHAPED QUANTUM TRANSISTOR BASED ON SCHOTTKY-GATE TECHNOLOGY, Physical review. B, Condensed matter, 53(15), 1996, pp. 9959-9963
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
15
Year of publication
1996
Pages
9959 - 9963
Database
ISI
SICI code
0163-1829(1996)53:15<9959:EIIATQ>2.0.ZU;2-H
Abstract
We have observed quantum interference in the electronic transport in a T-shaped Al0.3Ga0.7As/GaAs heterostructure. The geometry is defined b y four independent Schottky gates on top of the layer system. By chang ing the split-gate voltages, the dimensions of the T-shaped two-dimens ional electron gas could be varied continuously. Especially, the stub length of the transistor can be controlled in order to switch between constructive and destructive interference. An additional advantage of using gates instead of etching methods to define the geometry is the s mooth form of the boundary potential which implies specular boundary s cattering. At low temperatures the transport in the high mobility two- dimensional electron gas (2DEG) is ballistic. Thus weak-localization e ffects and conductance fluctuations are suppressed, whereas the intend ed interference pattern is reproducible and nearly identical for diffe rent samples. We attribute the observed resistance oscillations to the change in transmissivity in the device when the geometry is altered. Other explanations are discussed as well but could be excluded by expe riment.