TAILORING A HIGH-TRANSMISSION FIBER PROBE FOR PHOTON SCANNING TUNNELING MICROSCOPE

Transmission efficiency of a fiber probe used in photon scanning tunne ling microscope is evaluated as a function of aperture diameter. The a pertured probe has been fabricated by chemical etching technique and m etal coating. By comparing two types of probes with different cone ang les, we determine the most influential factor in The transmission prop erty of the metal-cladding tapered waveguide. A long tip with high eff iciency is developed by a multistep etching method so as to be suitabl e during actual scanning operation. Photoluminescence imaging of later al p-n junctions on the GaAs substrate is demonstrated in the illumina tion-collection hybrid mode operation of photon scanning tunneling mic roscope. (C) 1996 American Institute of Physics.