Calculations by drift diffusion and Monte Carlo methods and experiment
al data on the transient response of metal-semiconductor-metal photode
tectors are reported. We have shown how the interplay of carrier and d
isplacement currents, inhomogeneities in field and charge distribution
s, and hot electron effects determines observed structure in the trans
ient response. In particular, we have demonstrated the role played by
the regions under the contacts that are not illuminated in forming pea
ks in the transient response. We have also demonstrated that the peaks
in the transient response need not be attributed to velocity overshoo
t and the scaling of detector response with contact separation has bee
n studied. (C) 1996 American Institute of Physics.