Photoluminescence, measured as a function of hydrostatic pressure, has
been used to determine the band offsets of two tensile-strained GaxIn
1-xP-(AlyGa1-y)(0.52)In0.48P quantum-well structures. Unlike other tec
hniques commonly used to determine band offsets, this method has the a
dvantage that a detailed knowledge of the material parameters is not r
equired. Conduction-band offsets of Delta E(c) = (0.79 +/- 0.07)Delta
E(G)(HH) and Delta E(c) = (0.74 +/- 0.10)Delta E(G)(HH), where Delta E
(G)(HH) is the total heavy-hole-related band-gap discontinuity, are ob
tained for structures having strains of + 0.56 and + 0.71% and barrier
Al compositions of 0.7 and 0.55, respectively. Alternatively the band
offsets expressed in terms of the light-hole band-gap discontinuity a
re Delta E(c): Delta E(G)(LH) = 0.70:0.30 and 0.61:0.39 [corresponding
to absolute light-hole valence-band offsets of Delta E(V)(LH) = (110
+/- 12) meV and (113 +/- 15) meV] for the + 0.56 and + 0.71% strained
samples, respectively. At high pressures the structures become type II
, and the observed indirect real and k-space transition exhibits a blu
eshift with increasing incident laser power density. An analysis of th
is blueshift allows both the density and lifetime of the spatially sep
arated photoexcited carriers to be determined.