CLEAR EVIDENCE FOR STRAIN CHANGES ACCORDING TO CO LAYER THICKNESS IN METASTABLE CO PD(111) MULTILAYERS - AN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY/
Sk. Kim et al., CLEAR EVIDENCE FOR STRAIN CHANGES ACCORDING TO CO LAYER THICKNESS IN METASTABLE CO PD(111) MULTILAYERS - AN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY/, Physical review. B, Condensed matter, 53(16), 1996, pp. 11114-11119
We have measured fluorescence-yield extended x-ray absorption fine str
ucture (EXAFS) on a series of (Co x Angstrom+Pd 11 Angstrom)(13) metal
lic multilayers. To examine the local atomic structure around Co and i
ts anisotropy, Co K-edge EXAFS measurements were performed at near-gra
zing incidence of synchrotron radiation incorporating linear polarizat
ion dependence. We generally observed, with decreasing Co layer thickn
ess, increasing, in-plane interatomic distance and decreasing, out-of-
plane interatomic distance in Co atoms. For a (Co 10 Angstrom +Pd 11 A
ngstrom)(13) multilayer, strain values of in-plane and out-of-plane Co
atoms are estimated to be 3.6+/-0.5% in tensile and 3.0+/-0.4% in com
pressive strain.