CLEAR EVIDENCE FOR STRAIN CHANGES ACCORDING TO CO LAYER THICKNESS IN METASTABLE CO PD(111) MULTILAYERS - AN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY/

Citation
Sk. Kim et al., CLEAR EVIDENCE FOR STRAIN CHANGES ACCORDING TO CO LAYER THICKNESS IN METASTABLE CO PD(111) MULTILAYERS - AN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY/, Physical review. B, Condensed matter, 53(16), 1996, pp. 11114-11119
Citations number
41
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
16
Year of publication
1996
Pages
11114 - 11119
Database
ISI
SICI code
0163-1829(1996)53:16<11114:CEFSCA>2.0.ZU;2-A
Abstract
We have measured fluorescence-yield extended x-ray absorption fine str ucture (EXAFS) on a series of (Co x Angstrom+Pd 11 Angstrom)(13) metal lic multilayers. To examine the local atomic structure around Co and i ts anisotropy, Co K-edge EXAFS measurements were performed at near-gra zing incidence of synchrotron radiation incorporating linear polarizat ion dependence. We generally observed, with decreasing Co layer thickn ess, increasing, in-plane interatomic distance and decreasing, out-of- plane interatomic distance in Co atoms. For a (Co 10 Angstrom +Pd 11 A ngstrom)(13) multilayer, strain values of in-plane and out-of-plane Co atoms are estimated to be 3.6+/-0.5% in tensile and 3.0+/-0.4% in com pressive strain.