Common practices for predicting rates of single-event effects (SEE) in
microelectronics in space environments are reviewed. Established rate
-prediction models are discussed, and comparison is drawn between alte
rnative approaches with discussion of dominant modeling parameters, as
sumptions, and limitations and the impact on prediction results, Areas
of current uncertainty are identified. Approaches for obtaining model
parameters from test data are reviewed. The methods are illustrated b
y example calculations that explore the sensitivity of results on mode
l parameter choices.