COSMIC AND TERRESTRIAL SINGLE-EVENT RADIATION EFFECTS IN DYNAMIC RANDOM-ACCESS MEMORIES

Authors
MASSENGILL LW
Citation
Lw. Massengill, COSMIC AND TERRESTRIAL SINGLE-EVENT RADIATION EFFECTS IN DYNAMIC RANDOM-ACCESS MEMORIES, IEEE transactions on nuclear science, 43(2), 1996, pp. 576-593
Citations number
97
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
2
Year of publication
1996
Part
1
Pages
576 - 593
Database
ISI
SICI code
0018-9499(1996)43:2<576:CATSRE>2.0.ZU;2-F
Abstract
A review of the literature on single-event radiation effects (SEE) on MOS integrated-circuit dynamic random access memories (DRAM's) is pres ented. The sources of single-event (SE) radiation particles, causes of circuit information loss, experimental observations of SE information upset, technological developments for error mitigation, and relations hips of developmental trends to SE vulnerability are discussed.