EVIDENCE OF INTERFERENCE BETWEEN ELECTRON-PHONON AND ELECTRON-IMPURITY SCATTERING ON THE CONDUCTIVITY OF THIN METAL-FILMS

Citation
Pm. Echternach et al., EVIDENCE OF INTERFERENCE BETWEEN ELECTRON-PHONON AND ELECTRON-IMPURITY SCATTERING ON THE CONDUCTIVITY OF THIN METAL-FILMS, Physical review. B, Condensed matter, 47(20), 1993, pp. 13659-13663
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
47
Issue
20
Year of publication
1993
Pages
13659 - 13663
Database
ISI
SICI code
0163-1829(1993)47:20<13659:EOIBEA>2.0.ZU;2-S
Abstract
The temperature dependence of the resistivity rho of thin gold films ( thickness d = 100-400 angstrom) has been measured at T = 30 mK-300 K. In a wide temperature range below THETA(D)/15 (THETA(D) is the Debye t emperature) DELTArho(T)/rho is proportional to T2 and does not depend on the mean free path of electrons. Experimental determinations of the dependences DELTArho(T)/rho in this temperature range are in good agr eement with the correction to the impurity resistivity of a normal met al due to the quantum interference between the electron-phonon and ele ctron-impurity interactions.