NEW PHASE-SENSITIVE METHOD OF SINGLE-CRYSTAL CHARACTERIZATION UNDER X-RAY-DIFFRACTION CONDITIONS

A new phase-sensitive method for crystal lattice strain determination is proposed. The phase of the diffracted x-ray wave can be obtained fr om direct measurements of backscattered intensity. For this purpose we design conditions for creating a standing x-ray wave in a vacuum betw een two separated crystals. The measurement of the intensity of this w ave as a function of the angular position of the crystal makes it poss ible to uniquely determine the relative phase of the wave scattered by a crystal with a deformed lattice. The experimental setup and some pr eliminary results are discussed.