We have measured the current noise of silver thin-film resistors as a
function of current and temperature and for resistor lengths of 7000,
100, 30, and 1 mu m. As the resistor becomes shorter than the electron
-phonon interaction length, the current noise for large current increa
ses from a nearly current independent value to the interacting hot-ele
ctron value (root 3/4)2eI. However, further reduction in length below
the electron-electron interaction length decreases the noise to a valu
e approaching the independent hot-electron value (1/3)2eI first predic
ted for mesoscopic resistors.