THE MECHANICAL-BEHAVIOR OF INTERCONNECT MATERIALS FOR ELECTRONIC PACKAGING

Authors
Citation
Dr. Frear, THE MECHANICAL-BEHAVIOR OF INTERCONNECT MATERIALS FOR ELECTRONIC PACKAGING, JOM, 48(5), 1996, pp. 49-53
Citations number
13
Categorie Soggetti
Metallurgy & Metallurigical Engineering",Mineralogy,"Material Science
Journal title
JOMACNP
ISSN journal
10474838
Volume
48
Issue
5
Year of publication
1996
Pages
49 - 53
Database
ISI
SICI code
1047-4838(1996)48:5<49:TMOIMF>2.0.ZU;2-7
Abstract
A variety of new materials are needed for solder interconnects in elec tronic packages for high- and low-temperature applications. This artic le compares the mechanical behavior of low-temperature materials (Sn-4 0In-20Pb, Sn-58Bi, and a silver-loaded conductive adhesive) and high-m elting-temperature solders (Sn-3.5Ag, Sn-3.4Ag-4.8Bi, and Sn-4.7Ag-1.7 Cu) to near-eutectic Sn-40Pb solder. The results indicate that there are promising materials alternatives to the traditional Sn-Pb solders in electronic interconnect applications.