A VERY ACCURATE MEASUREMENT SYSTEM FOR MULTIELECTRODE CAPACITIVE SENSORS

Authors
TOTH FN MEIJER GCM KERKVLIET HMM
Citation
Fn. Toth et al., A VERY ACCURATE MEASUREMENT SYSTEM FOR MULTIELECTRODE CAPACITIVE SENSORS, IEEE transactions on instrumentation and measurement, 45(2), 1996, pp. 531-535
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
Journal title
IEEE transactions on instrumentation and measurement → ACNP
ISSN journal
00189456
Volume
45
Issue
2
Year of publication
1996
Pages
531 - 535
Database
ISI
SICI code
0018-9456(1996)45:2<531:AVAMSF>2.0.ZU;2-H
Abstract
A very accurate capacitance-measurement system consisting of a discret e capacitance-dependent oscillator and a microcontroller has been deve loped, It can measure multielectrode capacitors with capacitances up t o 2 pF, with an accuracy of 100 ppm with respect to a reference capaci tor. The resolution amounts to 50 aF with a total measurement time of 300 ms.