A SUBMICRON PRECISION SILICON TELESCOPE FOR BEAM TEST PURPOSES

Citation
C. Colledani et al., A SUBMICRON PRECISION SILICON TELESCOPE FOR BEAM TEST PURPOSES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 372(3), 1996, pp. 379-384
Citations number
18
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
372
Issue
3
Year of publication
1996
Pages
379 - 384
Database
ISI
SICI code
0168-9002(1996)372:3<379:ASPSTF>2.0.ZU;2-B
Abstract
A precise and compact silicon microstrip detector telescope designed t o provide reference information for charged particle tracks has been c onstructed. First operation results are presented. A signal over noise ratio higher than 100 has been obtained, resulting in a spatial resol ution of 1.4 mu m per detector, for a readout pitch of 50 mu m. At a p osition in the center of the telescope, a track extrapolation error of 0.7 mu m can be obtained fur reconstructed tracks.