Free-carrier absorption (FCA) of Hg1-xCdxTe epitaxial films is analyze
d by considering the composition-in-depth nonuniformity of epilayers.
The results show that epilayers exhibit different FCA behavior from bu
lk materials. Based on the analyses, the carrier concentration, the de
nsity and size distribution of Te precipitates, as well as the inclusi
on in Hg1-xCdxTe epilayers are derived from fitting the measured FCA s
pectra. (C) 1996 American Institute of Physics.