USE OF KRAMERS-KRONIG TRANSFORMS FOR THE TREATMENT OF ADMITTANCE SPECTROSCOPY DATA OF P-N-JUNCTIONS CONTAINING TRAPS

Citation
C. Leon et al., USE OF KRAMERS-KRONIG TRANSFORMS FOR THE TREATMENT OF ADMITTANCE SPECTROSCOPY DATA OF P-N-JUNCTIONS CONTAINING TRAPS, Journal of applied physics, 79(10), 1996, pp. 7830-7836
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
10
Year of publication
1996
Pages
7830 - 7836
Database
ISI
SICI code
0021-8979(1996)79:10<7830:UOKTFT>2.0.ZU;2-4
Abstract
The use of Kramers-Kronig transforms is proposed for the treatment of admittance spectroscopy data of junctions when significant shunt condu ctance or series resistance is present. An algorithm has been implemen ted to calculate the transformations numerically and the validity of t he method developed has been tested using simulated data. Two experime ntal systems, p-n junctions into InP made by ion implantation, and ato mic-layer-epitaxy-grown CdS/CdTe heterojunctions, have been characteri zed using this procedure. (C) 1996 American Institute of Physics.