INTRINSIC AND EXTRINSIC CAPACITANCES OF IN-PLANE-GATED TRANSISTORS

Citation
Dk. Devries et al., INTRINSIC AND EXTRINSIC CAPACITANCES OF IN-PLANE-GATED TRANSISTORS, Journal of applied physics, 79(10), 1996, pp. 8087-8090
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
10
Year of publication
1996
Pages
8087 - 8090
Database
ISI
SICI code
0021-8979(1996)79:10<8087:IAECOI>2.0.ZU;2-B
Abstract
The intrinsic and extrinsic capacitances of in-plane-gated (IPG) trans istors are calculated by conformal mapping. The capacitance per unit l ength between coplanar areas is only weakly dependent on the separatio n. It is essentially determined by the dielectric constant only and ha s a value of similar to 18 pF/m in air. In both ion-implanted and tren ch-etched IPG transistors the geometry is of minor importance for the low- and high-frequency behavior. (C) 1996 American Institute of Physi cs.