CHARACTERISTICS OF SELF-COMPENSATION IN PBSE-CL-SE-EX FILMS

Citation
Va. Zykov et al., CHARACTERISTICS OF SELF-COMPENSATION IN PBSE-CL-SE-EX FILMS, Semiconductors, 30(4), 1996, pp. 386-388
Citations number
5
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
30
Issue
4
Year of publication
1996
Pages
386 - 388
Database
ISI
SICI code
1063-7826(1996)30:4<386:COSIPF>2.0.ZU;2-4
Abstract
The morphology and electrical properties of epitaxial films of lead se lenide, doped with chlorine and excess selenium, on BaF2, were investi gated experimentally. The films were obtained by vacuum deposition by the hot-wall method. Self-compensation of the donor impurity (chlorine ) by intrinsic defects was recorded in the films with condensation tem peratures T-c above 300 degrees C. It was shown that self-compensation in the films is more difficult to achieve in the presence of point de fects, which at low condensation temperatures T-c completely suppress self-compensation. It was determined that the chlorine content in the films decreases as T-c increases. The conditions under which the degre e of compensation is maximum were estimated. (C) 1996 American Institu te of Physics.