The application of a new admittance-matching method to the design of d
ichroic mirrors is presented. The method is based on the alteration of
both thicknesses involved in the symmetrical period of the matching s
tack and provides the complete matching at the desired wavelength, i.e
., both conditions for the equivalent admittance and phase thickness a
re fulfilled. A supplementary condition, stated for the derivative of
the equivalent admittance with respect to the wavelength, produces a q
uasi-matching over a wide spectral range. A detailed description of th
e algorithm used by the computer program that performs this matching i
s given. (C) 1996 Society of Photo-Optical instrumentation Engineers.