LOCK-IN TECHNIQUE FOR MEASURING FRICTION ON A NANOMETER-SCALE

Authors
COLCHERO J LUNA M BARO AM
Citation
J. Colchero et al., LOCK-IN TECHNIQUE FOR MEASURING FRICTION ON A NANOMETER-SCALE, Applied physics letters, 68(20), 1996, pp. 2896-2898
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
68
Issue
20
Year of publication
1996
Pages
2896 - 2898
Database
ISI
SICI code
0003-6951(1996)68:20<2896:LTFMFO>2.0.ZU;2-C
Abstract
A method for measuring friction forces on a nanometer scale is describ ed. This method combines a lock-in technique with scanning force and f riction microscopy. Essentially, a lock-in amplifier is used to determ ine the amplitude of the friction loop. which is measured at high freq uency. To demonstrate the capability of this method, the dependence of the friction force with normal load is measured and a two dimensional image is presented. (C) 1996 American Institute of Physics.