APPARATUS FOR SMALL-ANGLE X-RAY-SCATTERING MEASUREMENTS OF POLYMER DEFORMATION

Authors
SALOMONS GJ SINGH MA GUPTA JA FORAN WA CLARKE JR CAPEL MS
Citation
Gj. Salomons et al., APPARATUS FOR SMALL-ANGLE X-RAY-SCATTERING MEASUREMENTS OF POLYMER DEFORMATION, Review of scientific instruments, 67(5), 1996, pp. 1748-1752
Citations number
15
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
67
Issue
5
Year of publication
1996
Pages
1748 - 1752
Database
ISI
SICI code
0034-6748(1996)67:5<1748:AFSXMO>2.0.ZU;2-9
Abstract
We present an apparatus which is capable of small-angle x-ray scatteri ng studies of polymer deformation at strain rates ranging from 49.6 mu m/s to less than 0.033 mu m/s and temperatures ranging from room (app roximate to 22 degrees C) to 120 degrees C. The system also includes a load cell for measuring the force applied to the sample and a symmetr ic stretching system to keep the sample centered in the x-ray beam. (C ) 1996 American Institute of Physics.