ASSEMBLY FOR RUTHERFORD BACKSCATTERING AT EXACTLY 180-DEGREES
Citation
H. Ellmer et al., ASSEMBLY FOR RUTHERFORD BACKSCATTERING AT EXACTLY 180-DEGREES, Review of scientific instruments, 67(5), 1996, pp. 1794-1799
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
SICI code
0034-6748(1996)67:5<1794:AFRBAE>2.0.ZU;2-X
Abstract
We describe a facility which allows us to measure projectiles scattere
d at an angle arbitrarily near 180 degrees. The backscattered projecti
les are detected in the horizontal plane out of the incoming beam by a
combination of electric and magnetic fields. The charged particles, w
hich are spatially dispersed according to their energy, are detected b
y a cooled 300 mm(2) ion implanted silicon detector. By a judicious ch
oice of the relative strength of both fields we ensure that the essent
ial Darts of the spectrum will not be distorted due to an energy depen
dent percentage of projectiles missing the detector. As the projectile
s are also dispersed according to their charge state we are able to di
stinguish between, e.g., singly and doubly charged He projectiles as t
hey hit the detector at different positions. The detector can be moved
in the vertical direction to continuously vary the backscatteling ang
le between 180 degrees and 178.5 degrees. This experimental result sho
ws for the first time the angular range to which the 180 degrees enhan
cement is confined. Such a device is ideally suited for investigating
single crystals by uniaxial channeling blocking. (C) 1996 American Ins
titute of Physics.