A MICROWAVE WAVE-GUIDE DEVICE FOR MEASURING THE UNIFORMITY OF CDXHG1-XTE EPITAXIAL-FILMS

This paper describes a waveguide device and a technique for checking t he uniformity of composition x over the area of a p-CdxHg1-xTe epitaxi al film. An equivalent circuit of the device operating in the 8-mm ban d and calculations of the reflectivity are given. The measurement accu racy of the photoconductivity decay time down to 15-20 nsec in low-res istance epitaxial films may be fairly high. The distribution of x over the film area is derived from the conductivity decay time measured at room temperature.