FINE-STRUCTURE MEASUREMENTS FOR NEGATIVE-IONS - STUDIES OF SE- AND TE-

Citation
J. Thogersen et al., FINE-STRUCTURE MEASUREMENTS FOR NEGATIVE-IONS - STUDIES OF SE- AND TE-, Physical review. A, 53(5), 1996, pp. 3023-3028
Citations number
20
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
53
Issue
5
Year of publication
1996
Pages
3023 - 3028
Database
ISI
SICI code
1050-2947(1996)53:5<3023:FMFN-S>2.0.ZU;2-L
Abstract
This paper comprises a comparison of experimental methods used for det ermining fine-structure splittings in negative atomic ions. The compar ison is based on experimental data for the fine-structure splittings o f the 4p(5) P-2 term of Se- and 5p(5) P-2 term of Te- obtained by sing le-photon detachment and three-photon detachment in a Raman coupling s cheme. The result for the J=3/2-1/2 splitting in Se- is found to be 22 78.2(2) cm(-1) while the J=3/2-1/2 splitting in Te- is 5004.6(5) cm(-1 ). A variety of experimental approaches to fine-structure measurements are briefly discussed. In many atomic negative ions the perspectives for improvements in the determination of fine-structure splittings are in the range of two to three orders of magnitude.