IMPROVING THE ACCURACY OF MEASUREMENT OF PARTS WITH CONTAMINATED SURFACES BY MULTICHANNEL OPTOELECTRONIC SYSTEMS

Authors
TELESHEVSKII VI VASILEV VV
Citation
Vi. Teleshevskii et Vv. Vasilev, IMPROVING THE ACCURACY OF MEASUREMENT OF PARTS WITH CONTAMINATED SURFACES BY MULTICHANNEL OPTOELECTRONIC SYSTEMS, Measurement techniques, 38(9), 1995, pp. 989-992
Citations number
6
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Measurement techniques → ACNP
ISSN journal
05431972
Volume
38
Issue
9
Year of publication
1995
Pages
989 - 992
Database
ISI
SICI code
0543-1972(1995)38:9<989:ITAOMO>2.0.ZU;2-8
Abstract
A method is proposed for improving the measurement accuracy of multich annel optoelectronic instruments in mechanical engineering. The method involves the suppression of crosstalk and processing of the measureme nt data in accordance with the resulting transfer function of the dete ctor. An example of practical implementation is given.