BROAD-BAND CHARACTERIZATION OF LOW DIELECTRIC-CONSTANT AND LOW DIELECTRIC LOSS CYTUF(TM) CYANATE ESTER PRINTED-CIRCUIT BOARD MATERIAL

Authors
DEUTSCH A SUROVIC CW LANZETTA AP AINSPAN HA ABBIATE JC VEIHBECK A HEDRICK JC SHAW JM TISDALE SL FOSTER EF COTEUS PW
Citation
A. Deutsch et al., BROAD-BAND CHARACTERIZATION OF LOW DIELECTRIC-CONSTANT AND LOW DIELECTRIC LOSS CYTUF(TM) CYANATE ESTER PRINTED-CIRCUIT BOARD MATERIAL, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 19(2), 1996, pp. 331-337
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
Journal title
IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging → ACNP
ISSN journal
10709894
Volume
19
Issue
2
Year of publication
1996
Pages
331 - 337
Database
ISI
SICI code
1070-9894(1996)19:2<331:BCOLDA>2.0.ZU;2-S
Abstract
Dielectric constant epsilon(r) and broadband dielectric loss tan delta measurements were performed for the thermoplastic toughened cyanate e ster printed circuit board CYTUF(TM) material, Characterization of tan delta over the 1-8 GHz frequency range was made using a simple short- pulse propagation technique, All the measurements were taken on four-m etal-layer, 23 x 36 cm cards with representative transmission line str uctures, It was found the epsilon(r) = 3.48 - 3.64 and tan delta = 0.0 095 - 0.01, which are much lower than for standard FR-4 material, The impact of improved characteristics on wireability is analyzed through simulations of representative printed circuit board interconnections.