EXTREME VALUES AND DISTRIBUTION OF LENGTHS OF GAPS IN SEQUENTIALLY MASKED (M)OVER-BAR-SEQUENCES

Authors
Citation
W. Freeman, EXTREME VALUES AND DISTRIBUTION OF LENGTHS OF GAPS IN SEQUENTIALLY MASKED (M)OVER-BAR-SEQUENCES, Electronics Letters, 32(7), 1996, pp. 625-626
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
32
Issue
7
Year of publication
1996
Pages
625 - 626
Database
ISI
SICI code
0013-5194(1996)32:7<625:EVADOL>2.0.ZU;2-8
Abstract
Sequentially-masked (m) over bar-sequences are a controllable pseudo-r andom source of binary pulses of various lengths, separated by gaps of various lengths. The distribution of lengths of gaps is important in many applications. Results, some analytic and some experimental (where analytic results are not obtainable), are given.