SELF-ALIGNED COMPLEMENTARY GAAS MISFETS USING A LOW-TEMPERATURE-GROWNGAAS GATE INSULATOR

Citation
Cl. Chen et al., SELF-ALIGNED COMPLEMENTARY GAAS MISFETS USING A LOW-TEMPERATURE-GROWNGAAS GATE INSULATOR, Electronics Letters, 32(4), 1996, pp. 407-409
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
32
Issue
4
Year of publication
1996
Pages
407 - 409
Database
ISI
SICI code
0013-5194(1996)32:4<407:SCGMUA>2.0.ZU;2-H
Abstract
GaAs complementary metal insulator semiconductor field effect transist ors (MISFETs) with a low temperature grown GaAs gate insulator were fa bricated using the same epitaxial layer structure. Self-aligned Si and Be implants were used for the source/drain region in n- and p-channel MISFETs, respectively. With a 1.5 mu m gate length, the maximum drain current is 40 and 120 mA/mm for a normally-off n- and p-channel MISFE T, respectively. It increases to 500 mA/mm for a normally-on n-channel device.