COMPARATIVE INVESTIGATION OF INTRINSIC JOSEPHSON CONTACTS IN HTC SUPERCONDUCTORS BY MODULATED MICROWAVE-ABSORPTION MEASUREMENTS

Citation
B. Nebendahl et al., COMPARATIVE INVESTIGATION OF INTRINSIC JOSEPHSON CONTACTS IN HTC SUPERCONDUCTORS BY MODULATED MICROWAVE-ABSORPTION MEASUREMENTS, Physica. C, Superconductivity, 209(4), 1993, pp. 362-368
Citations number
14
Categorie Soggetti
Physics, Applied
ISSN journal
09214534
Volume
209
Issue
4
Year of publication
1993
Pages
362 - 368
Database
ISI
SICI code
0921-4534(1993)209:4<362:CIOIJC>2.0.ZU;2-Y
Abstract
A quantitative analysis of the temperature dependence of modulated mic rowave absorption measurements in a sputtered film, a single crystal a nd a ceramic sample reveals two different types of intrinsic Josephson contacts. By modelling the complete temperature dependence of the mic rowave absorption signal, we were able to distinguish SNS- and SIS-typ e junctions. As a result we found SIS-type junctions for the granular (sputtered) layer, whereas the single crystal reveals SNS-typejunction s.