WAVELENGTH-TRACKED WHITE-LIGHT INTERFEROMETRY FOR HIGHLY SENSITIVE STRAIN AND TEMPERATURE-MEASUREMENTS

Authors
BHATIA V SEN MB MURPHY KA CLAUS RO
Citation
V. Bhatia et al., WAVELENGTH-TRACKED WHITE-LIGHT INTERFEROMETRY FOR HIGHLY SENSITIVE STRAIN AND TEMPERATURE-MEASUREMENTS, Electronics Letters, 32(3), 1996, pp. 247-249
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
32
Issue
3
Year of publication
1996
Pages
247 - 249
Database
ISI
SICI code
0013-5194(1996)32:3<247:WWIFHS>2.0.ZU;2-X
Abstract
A high-finesse extrinsic fibre Fabry-Perot cavity with a longitudinal dimension of several micrometres is interrogated using a broadband sou rce, and the spectral shift of a specific resonance band is employed t o implement strain and temperature sensors with resolutions of 0.0151 mu epsilon and 0.001 degrees C, respectively,.