DIAGNOSTIC SIMULATION OF STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS

Two faults are said to be equivalent, with respect to a test set T, if f they cannot be distinguished by any test in T. The sizes of the corr esponding equivalence classes of faults are used as a basis for compar ing the diagnostic capability of two given test sets. A novel algorith m, called ''multiway list splitting'', for computing the Equivalence C lasses of stuck-at faults, in combinational (full scan) circuits, with respect to a given test set is presented. Experimental results presen ted show the algorithm to be more efficient than previously known algo rithms based on decision diagrams and diagnosibility matrix.