FABRICATION OF N-CHANNEL AND P-CHANNEL IN-PLANE-GATE TRANSISTORS FROMSI SIGE/GE HETEROSTRUCTURES BY FOCUSED LASER-BEAM WRITING/

Citation
M. Holzmann et al., FABRICATION OF N-CHANNEL AND P-CHANNEL IN-PLANE-GATE TRANSISTORS FROMSI SIGE/GE HETEROSTRUCTURES BY FOCUSED LASER-BEAM WRITING/, Applied physics letters, 68(21), 1996, pp. 3025-3027
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
21
Year of publication
1996
Pages
3025 - 3027
Database
ISI
SICI code
0003-6951(1996)68:21<3025:FONAPI>2.0.ZU;2-J
Abstract
Focused laser beam writing is applied for thermally activated diffusio n of dopants into strained Si/Ge modulation-doped heterostructures. La teral p- and n-type potential barriers of sub-mu m width are achieved by local diffusion of boron and antimony into n- and p-type heterostru ctures, respectively. The potential modulation is determined from the temperature dependence of the thermionic current over the barrier. The se npn and pnp structures can be used to fabricate in-plane-gate trans istors which show transistor action up to room temperature. (C) 1996 A merican Institute of Physics.