M. Holzmann et al., FABRICATION OF N-CHANNEL AND P-CHANNEL IN-PLANE-GATE TRANSISTORS FROMSI SIGE/GE HETEROSTRUCTURES BY FOCUSED LASER-BEAM WRITING/, Applied physics letters, 68(21), 1996, pp. 3025-3027
Focused laser beam writing is applied for thermally activated diffusio
n of dopants into strained Si/Ge modulation-doped heterostructures. La
teral p- and n-type potential barriers of sub-mu m width are achieved
by local diffusion of boron and antimony into n- and p-type heterostru
ctures, respectively. The potential modulation is determined from the
temperature dependence of the thermionic current over the barrier. The
se npn and pnp structures can be used to fabricate in-plane-gate trans
istors which show transistor action up to room temperature. (C) 1996 A
merican Institute of Physics.