X-RAY-DIFFRACTION BEHAVIOR OF W TI SUPERLATTICES/

Citation
Fm. Pan et al., X-RAY-DIFFRACTION BEHAVIOR OF W TI SUPERLATTICES/, Physica status solidi. b, Basic research, 195(1), 1996, pp. 11-19
Citations number
17
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
03701972
Volume
195
Issue
1
Year of publication
1996
Pages
11 - 19
Database
ISI
SICI code
0370-1972(1996)195:1<11:XBOWTS>2.0.ZU;2-T
Abstract
The structural properties of periodic and quasiperiodic W/Ti superlatt ices have been investigated by means of X-ray diffraction. Intensity a ttenuation of even ordered peaks occurs in the spectra of W/Ti periodi c superlattices with near-equal-layer thicknesses. This phenomenon is theoretically explained. Two series of quasiperiodic (Fibonacci) sampl es are prepared, one with thickness ratio d(A)/d(B) = tau, and the oth er d(A)/d(B) = 1/tau. X-ray diffraction results of these quasiperiodic superlattices are discussed and compared. The possible application of Fibonacci films as optical elements in the soft X-ray region is discu ssed. Furthermore some X-ray diffraction spectra are simulated by comp uter calculation in order to understand the detailed structures. The c alculated results are in good agreement with measured ones.