CHARACTERIZATION OF 2-SOURCE EVAPORATED CADMIUM ZINC TELLURIDE THIN-FILMS

Thin films of Cd1-xZnxTe (0 less than or equal to x less than or equal to 1) have been deposited by two-source vacuum evaporation technique onto Coming 7059 glass substrates maintained at 573 K. The structural and optical properties of these films were studied. The composition de pendence of the optical band gap for the films was found to be curvi-l inear. The wavelength dependence of the refractive index and extinctio n coefficient of the films was studied. Reflectance spectra of the fil ms exhibited the prominent E(1).E(1) + Delta(1) and E(2) peak energies of the interband transitions. These peak energies were found to vary linearly with composition of the films.