EVALUATION OF THIN-FILMS OF FUNCTIONAL ORGANIC MATERIALS BY TOTAL-REFLECTION X-RAY-DIFFRACTION

The crystal structure and molecular orientation of lead phthalocyanine (PbPc) thin films onto a silicon (Si) and potassium bromide (KBr) wer e in-situ observed by using the new system combined a total reflection X-ray diffraction (TRXD) with an organic molecular beam deposition (O MBD). When the substrate was kept at a temperature of 25 degrees C, th e deposited films consisted of monoclinic crystals and the PbPc molecu les tend to orient with the column axis parallel to the surface. Furth er, the films deposited on Si at 100 degrees C consisted of the tricli nic crystals with the column axis parallel to the surface. While, the thin films on KBr exhibited much higher crystallinity than on Si, and same structures even if the substrate temperature of 180 degrees C was raised after deposition.