RESONANT RAMAN-SCATTERING IN HEXAGONAL GAN

Citation
D. Behr et al., RESONANT RAMAN-SCATTERING IN HEXAGONAL GAN, Applied physics letters, 68(17), 1996, pp. 2404-2406
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
17
Year of publication
1996
Pages
2404 - 2406
Database
ISI
SICI code
0003-6951(1996)68:17<2404:RRIHG>2.0.ZU;2-E
Abstract
We performed resonant Raman scattering in hexagonal GaN using discrete laser lines in the violet and UV spectral range for optical excitatio n. To tune the energetic position of the fundamental gap E(0) of GaN r elative to the exciting photon energy the sample temperature was varie d between 77 and 870 K. Analyzing both Stokes and anti-Stokes Raman sp ectra, the resonance profiles for Frohlich-induced one-E(1)(LO) and tw o-E(1)(LO) phonon scattering could be deduced, covering the energy ran ge from 0.5 eV below the E(0) gap up to the gap energy. The strength o f deformation-potential scattering by the A(1)(TO) mode was used as an internal reference. For excitation slightly above the E(0) gap energy E(1)(LO) multiphonon scattering up to the fourth order was observed, which reflects the stronger polarity of the Ga-N bond as compared to c onventional III-V semiconductors. (C) 1996 American Institute of Physi cs.