Passivation effects in In doped n-CdTe upon exposure to rf hydrogen pl
asma are studied by electrical and photoluminescence measurements and
were found to be maximum at about 150 degrees C. Depth profiling by ca
pacitance-voltage measurements show passivation of approximately an or
der of magnitude at 150 degrees C and 50% at 170 degrees C. No visual
surface damage is seen. Reverse bias annealing experiments show that a
tomic hydrogen drifts in a charged slate in n-CdTe, with reactivation
kinetics of the donors different from the other well studied semicondu
ctors. Manifestation of the donor passivation in photoluminescence is
seen by the reduction of the donor bound luminescence. (C) 1996 Americ
an Institute of Physics.