M. Desilva et al., HIGH-ASPECT-RATIO MICROTUNNEL TECHNIQUE TO EMPIRICALLY MODEL ELECTROLESS DEPOSITION, Journal of the Electrochemical Society, 143(4), 1996, pp. 78-80
A novel technique for studying the growth of electroless copper deposi
tion into high aspect ratio structures is presented. The advantage of
this technique is that growth into 100 to 400 mu m long trenches with
aspect ratios of 500:1 can be studied without any etching into the sub
strate. This technique allows us to determine diffusion kinetics, over
all growth rates, and to predict step coverage into trenches and vias.
The results indicate that electroless copper growth at 40 degrees C i
nto 0.7 mu m tunnels is diffusion controlled with an effective diffusi
on coefficient in the range of 2.0 to 8.9 x 10(-5) cm(2)/s.