HIGH-ASPECT-RATIO MICROTUNNEL TECHNIQUE TO EMPIRICALLY MODEL ELECTROLESS DEPOSITION

Citation
M. Desilva et al., HIGH-ASPECT-RATIO MICROTUNNEL TECHNIQUE TO EMPIRICALLY MODEL ELECTROLESS DEPOSITION, Journal of the Electrochemical Society, 143(4), 1996, pp. 78-80
Citations number
6
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
143
Issue
4
Year of publication
1996
Pages
78 - 80
Database
ISI
SICI code
0013-4651(1996)143:4<78:HMTTEM>2.0.ZU;2-X
Abstract
A novel technique for studying the growth of electroless copper deposi tion into high aspect ratio structures is presented. The advantage of this technique is that growth into 100 to 400 mu m long trenches with aspect ratios of 500:1 can be studied without any etching into the sub strate. This technique allows us to determine diffusion kinetics, over all growth rates, and to predict step coverage into trenches and vias. The results indicate that electroless copper growth at 40 degrees C i nto 0.7 mu m tunnels is diffusion controlled with an effective diffusi on coefficient in the range of 2.0 to 8.9 x 10(-5) cm(2)/s.