Vk. Dolganov et al., INVESTIGATION OF THE LAYER-BY-LAYER TRANSITION NEAR THE BULK SMECTIC-A-CRYSTAL-B TRANSITION IN THICK FREESTANDING FILMS, JETP letters, 63(4), 1996, pp. 285-289
Highly sensitive optical reflectivity measurements are used to investi
gate the layer-by-layer transition in extremely thin and thick N-(4-n-
hexyloxybenzylidene)-4-n-hexylaniline (60.6) films. The simple power-l
aw form, N=N(0)t(-1/3), for the penetration of the crystal-B order is
found to describe the transitions only near the surface. A deviation f
rom the power law is observed for the interior layers. (C) 1996 Americ
an Institute of Physics.