AUTOREGRESSIVE PROCESS FOR CHARACTERIZING STATISTICALLY ROUGH SURFACES

Authors
RASIGNI G LAFRAXO M BUAT V RASIGNI M ABDELLANI F LLEBARIA A
Citation
G. Rasigni et al., AUTOREGRESSIVE PROCESS FOR CHARACTERIZING STATISTICALLY ROUGH SURFACES, Journal of the Optical Society of America. A: Optics and image science, 10(6), 1993, pp. 1257-1262
Citations number
28
Categorie Soggetti
Optics
Journal title
Journal of the Optical Society of America. A: Optics and image science
ISSN journal
07403232 → ACNP
Volume
10
Issue
6
Year of publication
1993
Pages
1257 - 1262
Database
ISI
SICI code
1084-7529(1993)10:6<1257:APFCSR>2.0.ZU;2-Q
Abstract
It is shown that rough surfaces of thin silver films deposited on LiF underlayers may be accurately described by a low-order autoregressive process. The autoregressive (AR) parameters are determined, and the ad vantages of describing statistically rough surfaces of thin deposits b y linear models instead of with the traditional autocovariance functio n (ACF) or the profile power-spectral-density function (PPSDF) are dis cussed.