ESTIMATION OF LOW-TEMPERATURE CHARACTERISTICS OF JFETS FROM THEIR ROOM-TEMPERATURE CHARACTERISTICS

Authors
SREELAKSHMI K SATYAM M
Citation
K. Sreelakshmi et M. Satyam, ESTIMATION OF LOW-TEMPERATURE CHARACTERISTICS OF JFETS FROM THEIR ROOM-TEMPERATURE CHARACTERISTICS, Cryogenics, 36(5), 1996, pp. 325-331
Citations number
12
Categorie Soggetti
Physics, Applied",Thermodynamics
Journal title
Cryogenics → ACNP
ISSN journal
00112275
Volume
36
Issue
5
Year of publication
1996
Pages
325 - 331
Database
ISI
SICI code
0011-2275(1996)36:5<325:EOLCOJ>2.0.ZU;2-A
Abstract
This paper describes the measured electrical characteristics of JFETs in the temperature range from 300 K to 20 K. Also explained is an atte mpt to compute these characteristics at any temperature lower than 300 K knowing the characteristics at room temperature.