UNIVERSAL CONDUCTANCE FLUCTUATIONS IN METALLIC NANOSTRUCTURES

Citation
H. Hegger et al., UNIVERSAL CONDUCTANCE FLUCTUATIONS IN METALLIC NANOSTRUCTURES, Nanostructured materials, 6(5-8), 1995, pp. 807-810
Citations number
10
Categorie Soggetti
Material Science
Journal title
ISSN journal
09659773
Volume
6
Issue
5-8
Year of publication
1995
Pages
807 - 810
Database
ISI
SICI code
0965-9773(1995)6:5-8<807:UCFIMN>2.0.ZU;2-L
Abstract
WE investigated the magneto-conductance of gold nano-wires in a in mes oscopic 2-probe configuration. The nano-structures were fabricated usi ng a four-layer resist system and Electron beam lithography. The sampl es consisted of a wire of length L=100-1000 nm and cross section 30 x 30 nm(2) connected to two funnel-shaped contacts, At very low temperat ures T similar or equal to 100mmK the magneto-conductance of all measu red devices showed a rms-value delta G approximate to 0.1e(2)/h. Our m easurements demonstrate that the conductance fluctuations are strongly influenced by the contacts. This is most significant in the correlati on field B-c similar to 1/F psi which decreases with decreasing wire l ength. We also observed a weak dependence of delta G on the wire lengt h L which can be interpreted as a dimensional crossover from 1D (L gre ater than or equal to 400 nm) to 2D (L less than or equal to 200 nm).