CHARACTERISTICS OF DIELECTRIC BEHAVIOR IN NANOSTRUCTURED MATERIALS

Authors
MO CM ZHANG LD WANG GZ
Citation
Cm. Mo et al., CHARACTERISTICS OF DIELECTRIC BEHAVIOR IN NANOSTRUCTURED MATERIALS, Nanostructured materials, 6(5-8), 1995, pp. 823-826
Citations number
6
Categorie Soggetti
Material Science
Journal title
Nanostructured materials → ACNP
ISSN journal
09659773
Volume
6
Issue
5-8
Year of publication
1995
Pages
823 - 826
Database
ISI
SICI code
0965-9773(1995)6:5-8<823:CODBIN>2.0.ZU;2-S
Abstract
The dielectric behaviour of nanostructured TiO2, alpha - Al2O3, Si and amorphous silicon nitride was investigated. The mechanisms of the hig h dielectric constant, epsilon', and the size effect of epsilon' were discussed.