The crystallization phenomena of nano-sized silicon powders (similar t
o 20 nm) prepared by Plasma induced reaction of silane were studied us
ing in-situ heating in vacuum (<10(-8) Torr) in a high resolution tran
smission electron microscope (HRTEM) and ex-situ annealing in forming
gas monitored by X-ray diffraction (XRD). In-situ HRTEM measurements s
uggest that the primary crystallization process passes through two dis
tinct regions: the formation of nano-crystallites which is followed by
a sintering step which results in an increase in crystallite sizes. F
urther, from XRD spectra we interprete that smaller crystallites form
these larger grains which are observed by TEM.