GROWTH OF ZNSE THIN-FILMS BY RADICAL ASSISTED MOCVD METHOD

Citation
T. Aoki et al., GROWTH OF ZNSE THIN-FILMS BY RADICAL ASSISTED MOCVD METHOD, Applied surface science, 92, 1996, pp. 132-137
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
92
Year of publication
1996
Pages
132 - 137
Database
ISI
SICI code
0169-4332(1996)92:<132:GOZTBR>2.0.ZU;2-B
Abstract
ZnSe epitaxial films were grown by the low pressure metal organic chem ical vapor deposition (MOCVD) technique using diethylzinc and selenium hydride as the source materials. When H radicals generated by a rf gl ow discharge are introduced into the reaction site, the growth rate of the ZnSe film was increased by a factor of 10. The reactivity between source materials and H radicals was investigated for different pressu res, substrate temperatures as well as for different concentrations of H radicals and source materials. With the assistance of H radicals, e pitaxial growth of ZnSe films on Si substrates was realized at substra te temperatures above 400 degrees C. If the plasma is produced by N-2 gas, ZnSe films could be obtained similar to that of the H-2 plasma en vironment, This method is seen to be a promising technique in doping n itrogen into ZnSe in producing p-ZnSe films.