SURFACE ELECTRONIC-PROPERTIES OF GASE-COVERED SI(111) UPON UHV THERMAL-DESORPTION OF THE GASE EPITAXIAL LAYER

Citation
H. Reqqass et al., SURFACE ELECTRONIC-PROPERTIES OF GASE-COVERED SI(111) UPON UHV THERMAL-DESORPTION OF THE GASE EPITAXIAL LAYER, Applied surface science, 92, 1996, pp. 357-361
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
92
Year of publication
1996
Pages
357 - 361
Database
ISI
SICI code
0169-4332(1996)92:<357:SEOGSU>2.0.ZU;2-3
Abstract
Clean 7 x 7 reconstructed Si(111) surfaces have been epitaxially cover ed with a film of layered GaSe, The GaSe layers are parallel to the (1 11) plane of the Si substrate. Such a sample was sequentially Joule-he ated under ultra-high vacuum from room temperature to above 700 degree s C. Upon raising the temperature, the changes of the surface electron ic properties were studied try photoemission yield spectroscopy. Sever al steps in the dissociative desorption of GaSe were observed. The cor responding work function and band offsets as deduced from photoyield r esults are presented and discussed.