Cr. Lu et al., STUDY OF THE INTERNAL ELECTRIC-FIELDS ACROSS THE INTERFACES IN THE GAAS (1 A1,GA)AS MICROSTRUCTURES/, Applied surface science, 92, 1996, pp. 404-407
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
The electro-optical properties of MBE grown selectively doped GaAs/Al0
.3Ga0.7As heterostructures have been studied by photoreflectance spect
roscopy. The spectra contained three types of oscillations in differen
t spectra regions. The origins of different features in the spectra we
re identified by comparing the spectra after different layers were etc
hed off, and under external electric fields. There are two types of sp
ectra oscillations above the energy gap of the GaAs. The one with a la
rge oscillation period was due to the modulation of the internal elect
ric field in the cap region and the one with a small period originated
from the space-charge region near the back GaAs/Al0.3Ga0.7As interfac
e, The lineshape oscillations above the energy gap of Al0.3Ga0.7As ori
ginate from the undoped Al0.3Ga0.7As spacer. The internal electric fie
lds were deduced from the spectra, and compared with the numerically c
alculated results.